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Detection of Potential Memory Access Errors based on Assembly Codes
Hyun Soo Kim , Byeong Man Kim , Hyun Seop Bae , In Sang Chung The KIPS Transactions:PartD,
Vol. 18, No. 1, pp. 35-44,
Feb.
2011
10.3745/KIPSTD.2011.18.1.35
10.3745/KIPSTD.2011.18.1.35
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